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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
ISSN Online 2321-2004ISSN Print 2321-5526Since 2013
IJIREEICE meets the suggestive parameters outlined in the latest University Grants Commission (UGC) for peer-reviewed journals, ensuring high standards of research integrity, publication ethics, and academic excellence.
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Design and Performance Analysis of different shapes of Trigate FinFET at 20nm

Chatarpratap Singh Sohi, Karamjeet Singh, Davinder K. Thakur, Gurpurneet Kaur

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Abstract: With the invention of new technology below 22nm, leakage current is increasing exponentially due to the different Short Channel Effects (SCEs). FinFETs have gain attractive attention due to their superior electrostatic control over channel and hence low SCEs. In this work, multigate FinFETs for gate length of 20nm for three different shapes viz. Rectangular, Trapezoidal and Triangular with different fin heights are designed using Cogenda TCAD (Technology Computer Aided Design) tool. It was observed that for any fin height of multigate FinFETs, the Triangular fin shape showed better improvement in the electrical characteristics in terms of Drain-Induced Barrier Lowering (DIBL); Threshold voltage roll off (Vt); Sub-threshold Swing (SS); Leakage current (IOFF).The Rectangular trigate FinFET has very large leakage current which degrade its overall performance but it has maximum drive current (ION) as compare to other multigate FinFETs.

Keywords: FinFET; Drain-Induced Barrier Lowering; Threshold voltage roll off; Sub-threshold Swing; Leakage current, fin height, gate length.

How to Cite:

[1] Chatarpratap Singh Sohi, Karamjeet Singh, Davinder K. Thakur, Gurpurneet Kaur, β€œDesign and Performance Analysis of different shapes of Trigate FinFET at 20nm,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2016.41015

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