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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
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Modified Approach for Feature Space Improvement of Imagery

Sandeep V. Rode

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Abstract: This paper addresses the technique which is based on the maximum feature space improvement for the detailed analysis of the plant leaf images, implementation of the super-resolution to the given plant leaf image is possible by the method of locally linear embedding (LLE). In LLE, the feature space can be improved by imposing the neighbor pixels into feature space.

Keywords: Super Resolution, Plant Leaf, LLE

How to Cite:

[1] Sandeep V. Rode, “Modified Approach for Feature Space Improvement of Imagery,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2015.31011

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