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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
ISSN Online 2321-2004ISSN Print 2321-5526Since 2013
IJIREEICE meets the suggestive parameters outlined in the latest University Grants Commission (UGC) for peer-reviewed journals, ensuring high standards of research integrity, publication ethics, and academic excellence.
← Back to VOLUME 3, ISSUE 4, APRIL 2015

Multiplexer Based Digital Integrated Circuit Tester

Hema Thota, Sridhar Sammeta, Prudhvi Raj Thota

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Abstract: The basic function of the digital IC tester is to test digital IC for correct logical functioning as described in the truth table. It can test digital ICs having 14 pins. This model applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the outputs in the truth table. Any discrepancy in the functioning of the IC results in a fail indication through LEDs. The testing procedure is accomplished with the help of keys present on the main board. At this stage we had completed to test the most common used digital IC's used in our laboratories, mainly belonging to the 74TTL series. This tests various types of ICs like AND, OR, EX-OR, NAND, NOR and EX-NOR gates.

Keywords: Inequality detector, Multiplexer, Flip-flops, Socket and Counter.

How to Cite:

[1] Hema Thota, Sridhar Sammeta, Prudhvi Raj Thota, β€œMultiplexer Based Digital Integrated Circuit Tester,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2015.3413

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